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Andrea Orejarena & Caleb Stein – AMERICAN GLITCH

CHF 60.00

5 in stock

Author: Andrea Orejarena & Caleb Stein
Essay: David Campany and 35 other texts in 52-page booklet.
Dimensions: 28 x 21.2 cm, 156 pages, softcover
English
First edition Gnomic Book 2024
ISBN 978-1-9573010-4-4

5 in stock

Category:

Description

This first European solo exhibition by the New York based duo Andrea Orejarena (*1994, Colombia) and Caleb Stein (*1994, United Kingdom) presents photographs and films that deal with practices of simulation and narratives of disinformation. As an artist duo, Orejarena, a cognitive scientist and photographer, and Stein, a documentary photographer, are known for their conceptually documentary projects on individual perception and the collective construction of reality.

In reaction to the growing distrust in the distinction between reality and fiction that characterizes the present, the duo began an exploratory journey through social media and photography in 2020. They have created an initial archive of over 1.500 photographs and current visual forms that manifests the influence of conspiracy narratives on American society and individual perception.

This archive of photographic forms of “alternative facts” engages in dialogue with landscape photographs by Orejarena and Stein in the installation “American Glitch”, which documents and decodes the supposed locations of conspiratorial events. By embracing traditions such as road trips and street photography, American Glitch interweaves continuities from American photographic history with the new phenomena of contemporary online culture.

Since their project “Long Time No See” (2015–2020), the duo has been working on the pressing question of what role photography can play today in the interplay of perception and imagination. Long Time No See, created in collaboration with young Vietnamese artists and veterans in Hanoi, traces the artistic engagement with current memories and consequences of the Vietnam-American-War. In poetic portraits and landscape views, Long Time No See presents a visual exploration of the nuances between dissonant historical writings and visual forms, spanning documentation and subjective perception.

Orejarena & Stein’s work has been exhibited internationally, including at Vin Gallery in HCMC, Jiazazhi Press’s project space in Shanghai, Vincom Center for Contemporary Art in Hanoi, FOAM in Amsterdam, Ogden Museum of Southern Art in New Orleans, Palo Gallery in New York, The Curator’s Room in Amsterdam, Belfast Photo Festival, Arles Photo Festival, Encontros da Imagem, among others. Their first book, Long Time No See, was published by Jiazazhi Press in 2022. Their second book, American Glitch is published by Gnomic Book. Tactics & Mythologies is their first institutionally show worldwide.

Curated by Nadine Isabelle Henrich, Curator House of Photography.

Additional information

Weight 0.5 kg
Dimensions 28 × 21.2 × 3 cm